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The first electron microscope was built in 1931 by Ernst Ruska and Max Knoll at the Berlin Technische Hochschule. It was greatly developed through the 1950s and has allowed great advances in the natural sciences. The advantage of an electron beam is that it has a much smaller wavelength (see wave-particle duality), which allows a higher resolution - the measure of how close together two things can be before they are seen as one. Light microscopes allow a resolution of about 0.2 micrometres, whereas electron microscopes can have resolutions as low as 0.1 nanometers.
High voltage electron beams from a cathodeThe electrode of an electrochemical cell at which reduction occurs is referred to as the cathode . In an electrolytic cell the cathode is negatively charged and in a galvanic cell the cathode is positively charged. The oppositely charged electrode in that are focused by magnetThis article is about magnetized material. Magnet is also the name of a commune in the Allier departement, in France A magnet is an object that has a magnetic field. A so-called permanent magnet is made of a ferromagnetic material. Such materials consistic lenses on to the specimen. They are then magnified by a series of magnetic lenses until they hit photographic plate or light sensitive sensors - which transfer the image to a computer screen. The image produced is called an electron micrograph (EM).
The Transmission electron microscope (TEM) produces images by detecting electrons that are transmitted through the sample, while the Scanning electron microscopeant head The scanning electron microscope SEM is a type of electron microscope capable of producing high resolution images of a sample surface. Due to the manner in which the image is created, SEM images have a characteristic 3-dimensional quality and are (SEM) produces images by detecting secondary electrons which are emitted from the surface due to excitation by the primary electron beam.
Generally, the TEM resolution is about an order of magnitude better than the SEM resolution, however, because the SEM image relies on surface processes rather than transmission it is able to image bulk samples and has a much greater depth of view, and so can produce images that are a good representation of the 3D structure of the sample.
A Scanning Transmission Electron Microscope (STEM) is a specific sort of TEM, where the electrons still pass through the specimen, but, as in SEM, the sample is scanned in a raster fashion.
Samples viewed under an electron microscope have to be treated in many ways: